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SHETIME MIS22-S1F1-2000-A

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    Buy cheap SHETIME MIS22-S1F1-2000-A from wholesalers
     
    Buy cheap SHETIME MIS22-S1F1-2000-A from wholesalers
    • Buy cheap SHETIME MIS22-S1F1-2000-A from wholesalers
    • Buy cheap SHETIME MIS22-S1F1-2000-A from wholesalers

    SHETIME MIS22-S1F1-2000-A

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    Delivery Time : 3-5 working days
    Model Number : MIS22-S1F1-2000-A
    Brand Name : SHETIME
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    SHETIME MIS22-S1F1-2000-A

    Product Overview

    This specification covers performance, tests, and quality requirements for SIM Memory Card Connectors. These connectors provide space savings and improved functionality for system signal transfer.

    Applications: SIM Card Connectors

    Brand DONGGUAN GAOYUEDA ELECTRONICS CO.,LTD
    Customer P/N FP-090012
    Origin TAIWAN FACTORY:
    Material - Housing LCP S475 UL 94V-0
    Material - Contact C5191 (High performance copper alloy / Phosphor Bronze)
    Material - Shell SUS304-H
    Finish - Contact Area Gold Flash Plated on Contact Area; Gold over Nickel
    Finish - Solder Tails Gold Flash Plated on Solder Tails; Gold over Nickel
    Certifications UL 94V-0
    Part No.DescriptionRating CurrentContact ResistanceDielectric WithstandingInsulation ResistanceMating CycleOperating TemperatureMaterial - HousingMaterial - ContactMaterial - ShellFinish - Contact AreaFinish - Solder Tails
    MIS22-S1F1-2000-A( CD)MICOR SIM PUSN Card Holder (6+1P with CD)0.5A MAX.50 m MAX500V AC MIN.1000 M MIN.3000 CYCLES-25 TO +85LCP S475 UL 94V-0C5191SUS304-HGOLD FLASH PLATEDGOLD FLASH PLATED
    MIS11-S1F1-2000-A( CD)MICOR SIM PUSN Card Holder (6P without CD)0.5A MAX.50 m MAX500V AC MIN.1000 M MIN.3000 CYCLES-25 TO +85LCP S475 UL 94V-0C5191SUS304-HGOLD FLASH PLATEDGOLD FLASH PLATED
    Test DescriptionRequirementCondition
    Low-Signal Level Contact ResistanceR<100 mApply DC 50010% Volts between adjacent contacts of mated connectors for one minute. MIL-STD-202F, Method 302
    Insulation ResistanceR>1000 MApply DC 50010% Volts between adjacent contacts of mated connectors for one minute. MIL-STD-202F, Method 302
    Dielectric Withstanding VoltageNo discharge, flashover or breakdown.500 V initial and 250 V final for 1 minute. MIL-STD-202F, Method 301
    Retention Force100 Gram (0.98N) minimum (per pin)Mate connector with a suitable gauge for each pin at rate of 25 mm/min. MIL-STD-1344A, Method 2012.1
    VibrationDiscontinuity 1.0 microsec. MAXMate dummy card and subject to Vibration conditions for 2 hours in each of 3 axes. Amplitude: 1.52 mm P-P, Frequency: 10-55-10 Hz. MIL STD 202 Method 201
    Durability5000 cycles.The sample should be mounted in the at the rate of 25mm/min. MIL-STD-1344A, Method 2016
    SolderabilitySolderable area shall have minimum of 95% solder coverage.Subject the test area of contacts into flux for 30.5 seconds and then into solder bath, controlled at 2705, for 30.5 seconds.
    Salt SprayOxidation of not more than 5%Subject mated/unmated connectors to 51% salt-solution concentration, 352 for 24 hours. MTL-STD-1344A, Method 1001.1
    Temperature Life (Heat Aging)A. Products in 852 96 hours, the product can still be used normally. B. Products in 2605 or eight of the reflow temperature (maximum temperature of 260), the deformation of not more than 0.08 mm.MTL-STD-202F, Method 108A
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